Klystron Department

Metrology

 The Klystron QA and Metrology Group is primarily responsible for incoming inspection of manufactured parts.   The group assures that parts conform to all drawing requirements in accordance with ANSI Y14.5 and provides traceability and documentation.  Critical parts for high power RF devices are inspected 100%.  The group also performs special precision measurement and alignment tasks in support of various SLAC projects.

 

Much of the dimensional inspection is performed with the aid of modern Coordinate Measuring Machines.  The group utilizes four  such machines capable of up to 1 micron accuracy.  Machines are direct computer control which enhances accuracy, repeatability and productivity.

 

 

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A Zygo laser interferometer is used to characterize specular and semi-specular surfaces for flatness, form, and surface finish parameters with nanometer resolution. Dramatic 3D views are generated by software to illustrate surface irregularities.

 

 

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Surface finish parameters can also be measured using a Taylor Hobson profilometer with a resolution of 16nm.  In addition to determining over 30 surface finish parameters, this unit can be used to check surface form features such as radii and angles.

 

 

 

 

High gradient x-band accelerator structure undergoing straightness check and fiducialization with the aid of a coordinate measuring machine.

 

 

 

 

Thorough documentation is an integral part of the QA process.  Inspection reports are traceable to individual parts which are in turn traceable to completed devices. This allows investigations of device performance issues which may be correlated to actual part conditions.

 

 

 

 

A 5045 anode housing is being inspected with the aid of a .0001” resolution digital height gage.  A full complement of conventional metrology tools as well as specialty gages is available to suit the various QA requirements.

 

 

 

 

450 power digital video microscope being used to identify defects in a machined surface.

 

 

 

Last Page Update:
Monday July 17, 2006