Techniques and Instruments
In-house techniques and instruments enable imaging, topographic, chemical and elemental analyses of surfaces and the bulk.
- Surface analysis (X-ray photoelectron and Auger electron spectroscopies)
- Imaging (optical, secondary electron, and scanning probe microscopies),
- Bulk elemental analysis (Energy dispersive x-ray analysis), ambient field emission measurements, and secondary electron yield measurements.
- Thin film deposition and optical spectroscopy (both reflection and transmission) services.
