Electric Breakdown on Surfaces
Fundamental studies at nanometer-level, using atomic force microscopy to locate the native sources of field emission (necessary for initiation of breakdown) on accelerator materials, primarily copper.
Field emission (“Fowler-Nordheim”) measurements in controlled dry-N2 atmosphere show that these intrinsic sources are not identifiable by topographic methods and are apparently associated with subsurface native defects (as yet unidentified) in the material. Further work must move to UHV conditions, where searching for defects is better controlled and sensitive to surface potential.
Further reading: “Atomic force microscopy study of high electric field breakdown through thin oxide layers on copper”, SLAC-PUB-8600, August, 2000. (SLAC Document Server)
