High-Speed, High-Sensitivity sCMOS Image Sensors: Towards Single Photon Detection
CCDs have been the primary sensor used in imaging systems for 8-20 keV x-ray diffraction and scientific imaging applications in recent years. CCDs have met the fundamental requirements of low noise, high-sensitivity, high dynamic range and spatial resolution necessary for these scientific applications. Current state-of-the-art CMOS image sensor (CIS) technology has experienced dramatic improvements over the past several years. Its performance is rivaling or surpassing that of most CCDs. The advancement of CIS technology is at an ever-accelerating pace that is driven by the multi-billion dollar consumer market. There are several advantages of CIS over traditional CCDs and other solid-state imaging devices; those include low power, high-speed operation, lower cost and system-on-chip integration. The combination of superior imaging performance and system advantages makes CIS the perfect candidate for high-sensitivity imaging applications.
This abstract describe the development of a 2560x2160 pixel scientific (sCMOS) image sensor with a 6.5Ám pitch operating at 100 frames/second with a dynamic range >14 bits and a readout noise of under 2 electrons. Fundamental metrics of linearity, dynamic range, spatial resolution, conversion gain, sensitivity are estimated using visible light. X-ray performance is also described using a Gadox screen and 8 keV x-ray illumination.
Brian Rodricks - BAE Systems Imaging Solutions
Brian Rodricks received his MS degree from Ohio University and PhD in Condensed Matter Physics from the University of Michigan. He was the first Argonne Scholar at the Advanced Photon Source at the Argonne National Laboratory and subsequently worked as a Member of the Technical Staff developing instrumentation and techniques for high-speed imagining. He currently manages the Application and System Engineering group at BAE Systems Imaging Solutions (formerly Fairchild Imaging) developing high-performance imaging systems for x-ray and scientific imaging applications. He has over 20 years experience in the field of imaging- from optical to x-ray applications having also worked at Hologic Inc. developing TFT-based imaging system for medical applications and Micron Technology where he was involved in optical imaging for mobile applications. He is Co-Chair of Digital Photography at the SPIE and is a member of the editorial board for Review of Scientific Instruments.